Darkfield-scattering surface analysis in powder-based AM-processes: analysis of a multi-wavelength approach (Invited Paper)

In this study, we demonstrate the application of a laser-based multi-wavelength dark-field scattering technique for the surface analysis of powder-based additive manufacturing (AM) processes. Our experiments encompass a variety of materials commonly used in powder-based AM, providing a comprehensive assessment of the method's versatility. We detail the technique's efficacy in analyzing surface roughness, a critical factor affecting the mechanical properties and performance of AM parts. The results indicate that our approach can detect subtle, µm-sized variations in surface texture, offering a robust tool for improving the quality control and optimization of AM processes. The results showed that an axial resolution of down to 3 µm at a height range of multiple millimeters is achievable. The scanning of large areas with a size of 200 x 500 mm² can be performed at frame rates surpassing 100 fps. This method presents a significant advancement in the precision and applicability of surface analysis techniques in additive manufacturing, ensuring better control over the fabrication process and resulting in higher-quality end products.