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25 - 30 January 2025
San Francisco, California, US
Conference 13383 > Paper 13383-4
Paper 13383-4

High-volume production test methodology and parametrics of the Texas Instruments Phase Light Modulator (PLM)

29 January 2025 • 9:00 AM - 9:20 AM PST | Moscone South, Room 206 (Level 2)

Abstract

As DLP Products at Texas Instruments, Inc. approaches mass production for its phase light modulator (PLM), it builds on its decades of experience in manufacturing and testing digital micro-mirror devices (DMD) to launch a high-quality new product. Due to the fundamental differences in operation between the DMD and PLM, DLP Products has been developing new methodologies and parametrics to evaluate PLMs for high-volume production. This paper introduces the new tester hardware, test algorithms, test patterns, and some of the production metrics that are currently in use and how they inform us of the device characteristics.

Presenter

Griffin Orr
Texas Instruments Inc. (United States)
Griffin is a validation engineer at Texas Instruments DLP Products and has been there for four years. Prior to joining TI, he studied as an electrical engineer at Iowa State University. At DLP, Griffin works closely with MEMS designers to verify designs as they are iterated on and is also the project manager for the development of new phase light modulator devices.
Application tracks: Photonic Chips
Presenter/Author
Griffin Orr
Texas Instruments Inc. (United States)
Author
Taylor Byrum
Texas Instruments Inc. (United States)
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Texas Instruments Inc. (United States)
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Texas Instruments Inc. (United States)
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William McDonald
Texas Instruments Inc. (United States)
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Kristofer Oberascher
Texas Instruments Inc. (United States)
Author
Dennis Doane
Texas Instruments Inc. (United States)
Author
Texas Instruments Inc. (United States)
Author
Texas Instruments Inc. (United States)
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Texas Instruments Inc. (United States)
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Texas Instruments Inc. (United States)