15 - 18 September 2025
Madrid, Spain

Attend SPIE Sensors + Imaging 2025

Join the international event featuring the latest advances in security and defence and remote sensing systems
SPIE Sensors + Imaging 2025 Madrid, Spain

Plan to present in Madrid

Submit your research to this leading European event for advancing sensors and photonic technologies for homeland security, defence, satellite monitoring of the atmosphere, and imaging of the Earth’s ecosystems. Call for papers opens in January.

Event venue

IFEMA Madrid
Adva, delo Partenon, 5
28042 Madrid, Spain

Join your colleagues for Sensors + Imaging 2025


This meeting is the leading international gathering for researchers, engineers and scientists involved in the latest developments in sensing, data and signal analysis, optronics, quantum science, optical technologies, all aspects of Earth observation, next generation satellites, atmospheric propagation, imaging analytics, and funding programmes.

Why participate in Sensors + Imaging?


Technology shared at SPIE Sensors + Imaging

Hear the latest research

Join other leaders sharing the latest breakthroughs from around the globe

Attendees of SPIE Sensors + Imaging

Connect with colleagues

Technical and networking events to help you make important contacts

Speaker at SPIE Sensors + Imaging

World-class speakers

Listen to plenary presentations to learn latest challenges and opportunities

Engage with leading companies at the SPIE Sensors + Imaging exhibition


Learn more about the free exhibition

Companies will offer you an inside look into their portfolio of products and services — watch product demonstrations, connect in one-on-one conversations with company representatives, and find partnerships that will advance your work.

Student Members may qualify for support

SPIE Student Members are encouraged to apply for supplemental travel grants and fee waivers to attend Sensors + Imaging. Student Members who are presenting authors will be given priority selection, but grants are open to all Student Members.