SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.
SPIE Optical Metrology overview
Final programme (5 MB PDF)
Technical abstracts (2 MB PDF)
View 2017 event news + photos
View details for the collocated event, SPIE Digital Optical Technologies 2017
SPIE Optical Metrology is part of