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    Past event overview

    Munich, Germany

    SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

    SPIE Optical Metrology overview

    Final programme (5 MB PDF)

    Technical abstracts (2 MB PDF)

    View 2017 event news + photos

    View details for the collocated event, SPIE Digital Optical Technologies 2017

    SPIE Optical Metrology is part of