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    Past Event Overview

    SPIE Europe Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

    Co-located with LASER 2009, World of Photonics in Munich, Germany, the symposium addressed the role of lasers in the following areas:

    • Optical Measurement Systems for Industrial Inspection
    • Modeling Aspects in Optical Metrology
    • O3A: Optics for Arts, Architecture, and Archaeology

    Learn more about the 2009 event:

    Symposium Chairs
    Wolfgang Osten, Univ. Stuttgart (Germany)
    Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
    Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)