SPIE Boulder Damage 2008 concluded 24 September.
The Boulder Damage Symposium is the leading forum for the exchange of information on the physics and technology of materials for high power/high energy lasers. The series of conference proceedings has grown to be a comprehensive source of information on optics for lasers and includes topics on materials and thin film preparation, durability, properties modeling, testing, and component fabrication.
Technical Program PDF
2008 featured the following sessions and the Mini-symposium:
- Materials and Measurements
- Surfaces, Mirrors, and Contamination
- Thin Films
- Fundamental Mechanisms
- MINI-SYMPOSIUM: Damage to Fused Silica
- Thin Film Damage Competition
The 2008 Symposium included both poster and oral presentations with no parallel sessions. Also, distinguished international researchers in the field of optics for high-power/high-energy lasers presented invited talks.
Symposium Organizers
Conference Co-Chairs: Gregory J. Exarhos, Pacific Northwest National Lab.; Detlev Ristau, Laser Zentrum Hannover e.V. (Germany),M. J. Soileau, College of Optics & Photonics/Univ. of Central Florida; Christopher J. Stolz, Lawrence Livermore National Lab.
International Program Committee: Detlev Ristau, Laser Zentrum Hannover e.V. (Germany), Committee Chair
International Program Committee: James E. Andrew, AWE plc (United Kingdom); Hervé Bercegol, CEA Cesta (France); Mireille Commandré , Institut Fresnel (France); Michael D. Feit, Lawrence Livermore National Lab.; Jerry B. Franck, U.S. Army Night Vision & Electronic Sensors Directorate; Leonid B. Glebov, College of Optics & Photonics/Univ. of Central Florida; Vitaly E. Gruzdev, Univ. of Missouri/Columbia; Klaus Mann, Laser-Lab. Göttingen e.V. (Germany); Masataka Murahara, Tokai Univ. (Japan); Semyon Papernov, Amy L. Rigatti, Univ. of Rochester; Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China); Alan F. Stewart, The Boeing Co.; Kunio Yoshida, Osaka Institute of Technology (Japan)
Founding Organizers: Arthur H. Guenther and Alexander J. Glass
Technical Contact: Kent Rochford, National Institute of Standards and Technology
