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23 - 27 February 2025
San Jose, California, US

Advanced Lithography + Patterning Conferences

Find the conference topics that interest you most and submit your research

Featuring six conference topics

Topics range from optical and EUV lithography, patterning technologies, metrology, and process integration for semiconductor manufacturing and adjacent applications. Come hear the latest research at Advanced Lithography + Patterning. We are excited to offer another outstanding program.

Late abstract submissions will be considered until 6 January, 2025. See each conference for more information.

Conferences


  • Optical and EUV Nanolithography
  • DTCO and Computational Patterning
  • Metrology, Inspection, and Process Control
  • Novel Patterning Technologies
  • Advances in Patterning Materials and Processes
  • Advanced Etch Technology and Process Integration for Nanopatterning

View technical presentations

Paper Application Tracks


Putting focus on topical areas with application tracks

Application tracks list presentations on a topical area with broad-range interest so that participants can easily locate presentations in their areas of interest. In the 2025 program, these topics include AI / ML, sustainability, stochastics, advanced packaging, and EPE/overlay.

Featured courses related to conferences


Symposium Chairs


Qinghuang Lin

Canon Nanotechnologies, Inc. (United States)
Symposium Chair

John Robinson

KLA Corporation (United States)
Symposium Co-chair

Invitation from the Chairs to participate


Share your research at SPIE Advanced Lithography + Patterning. This invitation from the Symposium Chairs outlines all the reasons and benefits of being involved in this leading event. 

Learn more

Registration includes 50 SPIE Digital Library downloads


Access the research you need

Presentations and manuscripts presented at Advanced Lithography + Patterning are published in the Conference Proceedings on the SPIE Digital Library.